- Defect & Yield Management, Inc. Critical manufacturing processes demand real-time, interactive solutions. The success of many semiconductor products has become increasingly dependent on how quickly and how accurately individual processes can be analyzed and controlled.
- Leica Leica groups: Microscopy ; Scientific Instruments, Geosystems incl. Surveying, GPS Photogrammetry, Camera.
- ADE Corporation is a worldwide leader in the design, manufacture, marketing and service of metrology and inspection systems for the silicon wafer and computer disk manufacturing industry. Our systems analyze and report product quality at critical manufacturing process steps and provide quality certification data that is relied upon by semiconductor and computer disk manufacturers. More than 95% of all silicon wafers manufactured worldwide are measured at least once on ADE equipment.
- Atomika SIMS 4100 The Power Workhorse of Ion Microprobes.SIMS 4500 Semiconductor Depth Profiler for conventional and ultra shallow-junction depth profiling/dose monitoring. SIMS 4600 300 mm/200 mm depth profiler for full wafers.
- Four Dimensions is a manufacturer of advanced four-point probe systems for resistivity measuring and mapping including 300mm capability. We also manufacture CV map systems for monitoring low dose ion implantation, checking oxide integrity and carrier generation lifetime. We develop sophisticated control software, advanced analog and digital electronic circuitry and mechanical assemblies for our instruments.
- IN USA, Inc. designs and manufactures state-of-the-art ozone monitoring and control instrumentation and provides custom engineering solutions for the process instrumentation market. Our dedication to quality, reliability, and technological innovation has earned us a reputation as the leading supplier of ozone instrumentation. Our world-wide sales and distribution network provides our customers with continuing applications support and technical expertise.
- Leica Microsystems Wetzlar GmbH introduced a new generation optics with ultra-high resolution using Deep UV light. This latest advancement in optical inspection represented through the Leica INM 300 DUV defect inspection and failure analysis microscope.
- Temptronic Corp. the leader in failure analysis semiconductor temperature testing and thermal air forcing system equipment. Hot Chucks, Cold Chuck, Wafer Probing at high temerature thermal inducing, temperature testing wafers and component test systems.
- MIDAC Corporation - the industry leader in application-specific FTIR spectrometers for laboratory, plant, on-line, and field use. MIDAC is your source for a wide range of FTIR solutions including hardware, software, integrated systems and even consultation whether you need: semiconductor gas analyzers, portable fuel or oil analyzers, indoor air quality monitors, corrosive gas moisture analyzers, outdoor fenceline monitoring systems, academic systems and software, dedicated QC workstations, service lab analyzers, research laboratory systems, or other rugged, reliable FTIR solutions.
- Solecon Laboratories, Inc. - spreading resistance and 4 point probe testing laboratories for use by the silicon and germanium semiconductor wafer fabs.. We provide silicon depth profiling to the semiconductor processing industry using Spreading Resistance Analysis (SRA). Briefly, SRA: provides profiles of carrier concentration vs. depth in silicon or germanium. can be done at any stage of the wafer fabrication process. is offered as a service (i.e., you send us samples and we send you profiles.) has been Solecon Labs' area of excellence for over 20 years.
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