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Semiconductor Test, Assembly & Packaging :Inspection :Focused Ion Beam Systems
     

  • Micron Technology, Inc. founded and incorporated in 1978, manufactures and markets 16 Meg and 64 Meg dynamic random access memory (DRAM) components in EDO and Synchronous architectures and varying word widths (x4, x8, x16); Graphics DRAMs; Synchronous SRAMs (pipelined and non-pipelined); and Flash Memory. All of Micron's DRAMs are produced using .25, .21, or .18 micron line widths...  

  • FEI The technology leader in focused ion beam and electron beam solutions. You are invited to take a look at FEI Company, offering our complete line of FIB, SEM, TEM, and ESEM products serving semiconductor, thin film head, material science, and life science applications.  

  • Schlumberger Automated Test Equipment provides the world's most comprehensive systems and services for probing, repairing, testing and handling semiconductor devices. It also offers measurement systems for front-end applications, as well as equipment to test complete electronic assemblies for the telecommunications industry.  


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